aps Solutions Product Portfolio
Highly customized test solutions by specific contact elements for comprehensive test applications make the perfect testing choices in ATE & SLT environment
RF - Coaxial - High Current - High Voltage- High Temperature - High Frequency
Cutomized Cantilever Probe Cards,
Hiigh Speed, Parametric, WLCSP,
A Broad range of probing hardware. EBI's inventories are one of the largest for probing tips, tip holdes, extension cables, triaxial / RF heads / adapters, micropositioners and microscopes
mmW - RF - University - ...
for engineering Purpose
From Mini Desktop Handler up to High Volume Handling Sytem scalable
Pick n Place Handling Systems for High Volume Testing for most applications like WLCSP, optical, Logic/ASIC, MEMS, Optical, Tri-Temp
Check and repair your Probe Card on site
for your all your probing needs